2015 International Conference on Solid State Devices and Materials

Sep 27, 2015 - Sep 30, 2015
Sapporo Convention Center, Sapporo, Japan

[PS-12-7] Exchange Bias Effects in Ni₂MnAl/Ferromagnet Film Bilayers

^○T. Kubota¹, T. Tsuchiya¹, T. Sugiyama¹, K. Takanashi¹ (1.Tohoku Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.PS-12-7

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