The Japan Society of Applied Physics

[PS-2-14] Impact and Improvement of Resistor Process Variation on RF Passive Circuit Design in Integrated Passive Devices (IPD) Technology

Y. C. Chang1,2, P. Y. Wang1, S. H. Hsu1, Y. T. Chang3, C. K. Chen3, D. C. Chang2 (1.National Tsing Hua Univ., 2.National Chip Implementation Center, National Applied Res. Labs., 3.Bureau of Standards, Metrology and Inspection, MOEA(Taiwan))

https://doi.org/10.7567/SSDM.2015.PS-2-14