[PS-3-5] Low Frequency Noise and Mobility Correlation from RT to Low Temperatures for n-Channel Ge MOSFETs

^○S. Ghosh¹, P. Bhatt¹, Y. Tiwari¹, S. Lodha¹ (1.IIT Bombay(India))

https://doi.org/10.7567/SSDM.2015.PS-3-5