[PS-3-7] 1/f Noise Performances and Noise Sources of Accumulation Mode Si(100) n-MOSFETs

^○P. Gaubert¹, A. Teramoto¹, S. Sugawa¹ (1.Tohoku Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.PS-3-7