[PS-4-9] Properties of SiC Resistive Memory for Harsh Environments

^○K. Morgan¹, J. Fan¹, R. Huang¹, L. Zhong¹, R. Gowers¹, L. Jiang¹, K. De Groot¹ (1.Univ. of Southampton(UK))

https://doi.org/10.7567/SSDM.2015.PS-4-9