The Japan Society of Applied Physics

[PS-6-5] Analysis of Electrical Characteristics of AlGaN/GaN on Si Large SBD by Changing Structure

H. S. Lee1,2, D. Y. Jung1, Y. R. Park1, J. H. Na1, H. G. Jang1, H. Lee1, C. H. Jun1, J. B. Park1, Z. S. Kim1, J. K. Mun1, S. O. Ryu2, S. C. Ko1, NamE. S. 1 (1.Electronics and Telecommunications Res. Inst., 2.Dankook Univ.(Korea))

https://doi.org/10.7567/SSDM.2015.PS-6-5