The Japan Society of Applied Physics

[PS-8-16] Topography and Atomic Strain Deformation of Epitaxial Graphene on Si-terminated 6H-SiC Extended to the Few Microns Order

G. Rius1, N. Mestres2, Y. Tanaka1, O. Eryu1, P. Godignon3 (1.Nagoya Inst. of Tech., 2.ICMAB-CSIC, 3.IMB-CNM-CSIC(Japan))

https://doi.org/10.7567/SSDM.2015.PS-8-16