[PS-8-16] Topography and Atomic Strain Deformation of Epitaxial Graphene on Si-terminated 6H-SiC Extended to the Few Microns Order

^○G. Rius¹, N. Mestres², Y. Tanaka¹, O. Eryu¹, P. Godignon³ (1.Nagoya Inst. of Tech., 2.ICMAB-CSIC, 3.IMB-CNM-CSIC(Japan))

https://doi.org/10.7567/SSDM.2015.PS-8-16