Transient Analysis of Oblique Hanle Signals Observed in GaAs

2015 International Conference on Solid State Devices and Materials

Sep 27, 2015 - Sep 30, 2015
Sapporo Convention Center, Sapporo, Japan

^○Z. C. Lin¹, M. Yamamoto¹, T. Uemura¹ (1.Hokkaido Univ.(Japan))