Special Features in Stress Degradation of SiC-MOSFETs Observed in I-V Characteristics

2015 International Conference on Solid State Devices and Materials

Sep 27, 2015 - Sep 30, 2015
Sapporo Convention Center, Sapporo, Japan

^○E. Murakami¹, K. Oda¹, T. Takeshita¹ (1.Kyushu Sangyo Univ.(Japan))