[PS-2-14] Impact and Improvement of Resistor Process Variation on RF Passive Circuit Design in Integrated Passive Devices (IPD) Technology
○Y. C. Chang1,2, P. Y. Wang1, S. H. Hsu1, Y. T. Chang3, C. K. Chen3, D. C. Chang2
(1.National Tsing Hua Univ., 2.National Chip Implementation Center, National Applied Res. Labs., 3.Bureau of Standards, Metrology and Inspection, MOEA(Taiwan))