The Japan Society of Applied Physics

9:30 AM - 9:50 AM

[A-3-01] Evaluation of Effective Mass of Inversion-layer Holes in Strained-Si pMOSFETs utilizing Shubnikov de-Haas (SdH) Oscillation

A. Shimada1, R. Nakane1, M. Takenaka1,2,S. Takagi1,2 (1.Univ. of Tokyo(Japan), 2.JST-CREST(Japan))

https://doi.org/10.7567/SSDM.2016.A-3-01