10:20 〜 10:40

[A-5-03] An Investigation of the Parasitic RC Effects in Nano-scaled FinFETs and Its Impact on SRAM Cells

^○B. R. Huang¹, F. H. Meng¹, Y. C. King¹, C. J. Lin¹ (1.National Tsing Hua Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2016.A-5-03