16:15 〜 16:35

[B-2-03] Highly Reliable MTJ-Based Nonvolatile Logic-in-Memory LSI with Content-Aware Write Error Masking Scheme

^○M. Natsui¹, A. Tamakoshi¹, T. Endoh¹, H. Ohno¹, T. Hanyu¹ (1.Tohoku Univ.(Japan))

https://doi.org/10.7567/SSDM.2016.B-2-03