The Japan Society of Applied Physics

4:15 PM - 4:35 PM

[B-2-03] Highly Reliable MTJ-Based Nonvolatile Logic-in-Memory LSI with Content-Aware Write Error Masking Scheme

M. Natsui1, A. Tamakoshi1, T. Endoh1, H. Ohno1, T. Hanyu1 (1.Tohoku Univ.(Japan))

https://doi.org/10.7567/SSDM.2016.B-2-03