16:55 〜 17:15

[B-2-05] Long-Term Reliable Physically Unclonable Function using Oxide Tunnel Barrier Breakdown on 2T-2MTJ Based Embedded-STT-MRAM

^○S. Takaya¹, T. Tanamoto¹, H. Noguchi¹, K. Ikegami¹, K. Abe¹, S. Fujita¹ (1.Toshiba Corp.(Japan))

https://doi.org/10.7567/SSDM.2016.B-2-05