9:30 AM - 9:50 AM

[B-3-02] Switching Operation of Double-Layer Conductive Bridging RAM Investigated using In-situ Transmission Electron Microscopy

^○M. Arita¹, S. Hirata¹, A. Takahashi¹, T. Hiroi¹, M. Jo¹, A. Tsurumaki-Fukuchi¹, Y. Takahashi¹ (1.Hokkaido Univ.(Japan))

https://doi.org/10.7567/SSDM.2016.B-3-02