09:50 〜 10:10

[B-3-03] Analysis of "hot spot" in Conducting-bridge Random Access Memory (CBRAM) by Impedance Method

^○A. Fukushima¹, K. Kinoshita¹ (1.Tottori Univ.(Japan))

https://doi.org/10.7567/SSDM.2016.B-3-03