14:00 〜 14:15

[E-4-02] Analysis of 4H-SiC IGBT Switching in the Presence of Interface Traps using Miller Plateau Characteristics

^○D. Navarro¹, A. Tone², H. Kikuchihara², Y. Morikawa¹, M. Miura-Mattausch² (1.Silvaco Japan(Japan), 2.Hiroshima Univ.(Japan))

https://doi.org/10.7567/SSDM.2016.E-4-02