1:30 PM - 2:00 PM

[N-4-01(Invited)] Reliability challenges for GaN-based FETs

^○M. Kuball¹, M. Uren¹, J. Pomeroy¹, S. Karboyan¹, I. Chatterjee¹, D. Liu¹, J. Anaya¹, T. Brazzini¹ (1.Univ. of Bristol(UK))

https://doi.org/10.7567/SSDM.2016.N-4-01