2016 International Conference on Solid State Devices and Materials
Sep 26, 2016 - Sep 29, 2016 Tsukuba International Congress Center, Tsukuba, Japan
3:00 PM - 5:00 PM
[PS-1-11] Microstructure Analysis of Nanosized Advanced Materials through the ACOM-TEM Technique
○A. Valery1,2, L. Gaben1, M. Grégoire1, Y. Le-Friec1, F. Lorut1, L. Clément1 (1.STMicroelectronics(France), 2.Univ. Grenoble Alpes, CNRS, SIMAP(France))
