The Japan Society of Applied Physics

15:00 〜 17:00

[PS-1-11] Microstructure Analysis of Nanosized Advanced Materials through the ACOM-TEM Technique

A. Valery1,2, L. Gaben1, M. Grégoire1, Y. Le-Friec1, F. Lorut1, L. Clément1 (1.STMicroelectronics(France), 2.Univ. Grenoble Alpes, CNRS, SIMAP(France))

https://doi.org/10.7567/SSDM.2016.PS-1-11