11:30 AM - 11:33 AM
[PS-1-11] Microstructure Analysis of Nanosized Advanced Materials through the ACOM-TEM Technique
○A. Valery1,2, L. Gaben1, M. Grégoire1, Y. Le-Friec1, F. Lorut1, L. Clément1
(1.STMicroelectronics(France), 2.Univ. Grenoble Alpes, CNRS, SIMAP(France))