15:00 〜 17:00

[PS-2-07] Rotation Analysis of the Light Scattering Variation of Latent Flaws through Light Scattering Measurement with Applied Stress Effect

^○Y. Sakata¹, N. Terasaki¹, K. Sakai¹, K. Nonaka¹ (1.AIST(Japan))

https://doi.org/10.7567/SSDM.2016.PS-2-5-07