3:00 PM - 5:00 PM [PS-2-07] Rotation Analysis of the Light Scattering Variation of Latent Flaws through Light Scattering Measurement with Applied Stress Effect ○Y. Sakata1, N. Terasaki1, K. Sakai1, K. Nonaka1 (1.AIST(Japan)) https://doi.org/10.7567/SSDM.2016.PS-2-5-07
