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[PS-5-04] Noise Analysis of a Serial Multiple Sampling in Back-Illuminated CMOS Image Sensor

^○H. Wakabayashi¹, K. Yamaguchi¹, Y. Yamagata² (1.Sony Semiconductor Solutions Corp.(Japan), 2.Sony LSI Design Inc.(Japan))

https://doi.org/10.7567/SSDM.2016.PS-2-5-16