The Japan Society of Applied Physics

2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日 〜 2016年9月29日
Tsukuba International Congress Center, Tsukuba, Japan

11:18 〜 11:21

[PS-2-07] Rotation Analysis of the Light Scattering Variation of Latent Flaws through Light Scattering Measurement with Applied Stress Effect

○Y. Sakata1, N. Terasaki1, K. Sakai1, K. Nonaka1 (1.AIST(Japan))