15:00 〜 17:00

[PS-3-04] Investigation of Ge Channel Negative Capacitance FET with Analytical Model: Impact of Ferroelectric Dielectrics

^○Y. Peng¹, G. Han¹, Z. Chen¹, Q. Li¹, C. Zhang¹, J. Zhang¹, Y. Hao¹ (1.Xidian Univ.(China))

https://doi.org/10.7567/SSDM.2016.PS-3-04