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[PS-3-08] Negative Bias Temperature Instability by Body Bias on Ring Oscillators in Thin BOX Fully-Depleted Silicon on Insulator Process

^○R. Kishida¹, K. Kobayashi¹ (1.Kyoto Inst. of Tech.(Japan))

https://doi.org/10.7567/SSDM.2016.PS-3-08