Influence of Line-Edge Roughness (LER) on Multiple-Gate (MG) Tunnel Field-Effect Transistors (TFETs)

2016 International Conference on Solid State Devices and Materials

Sep 26, 2016 - Sep 29, 2016
Tsukuba International Congress Center, Tsukuba, Japan

11:06 AM - 11:09 AM

^○W. Y. Choi¹, S. H. Choi¹, J. W. Lee¹, I. Huh¹ (1.Sogang Univ.(Korea))