A Physical Based Model for Negative Bias Temperature Instability

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜 2016年9月29日
Tsukuba International Congress Center, Tsukuba, Japan

11:18 〜 11:21

C. Ma¹,^○F. Sun¹, L. Zhang², X. Lin¹, M. Chan² (1.Peking Univ.(China), 2.Hong Kong Univ. of Sci. and Tech.(Hong Kong))