A Physical Based Model for Negative Bias Temperature Instability

2016 International Conference on Solid State Devices and Materials

Sep 26, 2016 - Sep 29, 2016
Tsukuba International Congress Center, Tsukuba, Japan

11:18 AM - 11:21 AM

C. Ma¹,^○F. Sun¹, L. Zhang², X. Lin¹, M. Chan² (1.Peking Univ.(China), 2.Hong Kong Univ. of Sci. and Tech.(Hong Kong))