15:00 〜 17:00 [PS-4-06] SiCOH Low-k material based RRAM for BEOL Process Compatible Nonvolatile Memory Application ○L. Zheng1, Y. Dai1, L. Yu1, L. Chen1, Q. Sun1, S. Ding1, W. Zhang1 (1.Fudan Univ.(China)) https://doi.org/10.7567/SSDM.2016.PS-4-06