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[PS-7-12] Wavelength Dependent Photodetection Characteristics of Avalanche Photodiode Fabricated by Standard CMOS Process

^○Z. A. F. M. Napiah^1,2, T. Hishiki¹, K. Iiyama¹ (1.Kanazawa Univ.(Japan), 2.UTeM(Malaysia))

https://doi.org/10.7567/SSDM.2016.PS-7-12