11:33 〜 11:36

[PS-7-12] Wavelength Dependent Photodetection Characteristics of Avalanche Photodiode Fabricated by Standard CMOS Process

^○Z. A. F. M. Napiah^1,2, T. Hishiki¹, K. Iiyama¹ (1.Kanazawa Univ.(Japan), 2.UTeM(Malaysia))