11:55 AM - 12:15 PM
[A-6-03] In-situ Observation of Cu Residuals in Resistance Switching Failure of MoOx/Al2O3 CBRAM
○M. Arita1, R. Ishikawa1, S. Hirata1, A. Turumaki-Fukuchi1, Y. Takahashi1
(1.Hokkaido Univ. (Japan))
https://doi.org/10.7567/SSDM.2017.A-6-03