3:40 PM - 4:00 PM
[A-8-02] Origin of the difference between high resistive and low resistive structures for interfacial phase change memories based on GeTe/Sb2Te3 superlattice
○H. Shirakawa1, M. Araidai1, K. Shiraishi1
(1.Nagoya Univ. (Japan))
https://doi.org/10.7567/SSDM.2017.A-8-02