The Japan Society of Applied Physics

3:40 PM - 4:00 PM

[A-8-02] Origin of the difference between high resistive and low resistive structures for interfacial phase change memories based on GeTe/Sb2Te3 superlattice

H. Shirakawa1, M. Araidai1, K. Shiraishi1 (1.Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.A-8-02