The Japan Society of Applied Physics

16:55 〜 17:10

[B-2-05] Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction

R. Abe1, H. Kojima1, M. Kikuchi2, T. Watanabe3, T. Koganezawa3, N. Yoshimoto2, I. Hirosawa3, M. Nakamura1 (1.NAIST (Japan), 2.Iwate Univ. (Japan), 3.Japan Synchrotron Radiation Research Institute (Japan))

https://doi.org/10.7567/SSDM.2017.B-2-05