Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction

R. Abe

doi:https://doi.org/10.7567/SSDM.2017.B-2-05

4:55 PM - 5:10 PM

[B-2-05] Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction

^○R. Abe¹, H. Kojima¹, M. Kikuchi², T. Watanabe³, T. Koganezawa³, N. Yoshimoto², I. Hirosawa³, M. Nakamura¹ (1.NAIST (Japan), 2.Iwate Univ. (Japan), 3.Japan Synchrotron Radiation Research Institute (Japan))

https://doi.org/10.7567/SSDM.2017.B-2-05

2017 International Conference on Solid State Devices and Materials

[B-2-05] Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction