1:30 PM - 2:00 PM

[C-1-01 (Invited)] Crystal Growth of CZ-Si and Relationship between Carrier Lifetime and Defects

^○K. Kakimoto¹, Y. Miyamura¹, H. Harada¹, L. Qin¹, S. Nakano¹ (1.Kyushu Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.C-1-01