2017 International Conference on Solid State Devices and Materials
Sep 19, 2017 - Sep 22, 2017 Sendai International Center
9:30 AM - 10:00 AM
[E-5-01 (Invited)] Improvement of Device and Circuit Performance of Si-based Tunnel Field-Effect Transistors by Utilizing Isoelectronic Trap Technology
○T. Mori1, H. Asai1, T. Matsukawa1 (1.AIST (Japan))
