The Japan Society of Applied Physics

10:35 〜 10:50

[E-5-04 (Late News)] Lowering Minimum Operation Voltage (Vmin) in SRAM Array by Post-Fabrication Self-Improvement of Cell Stability by Multiple Stress Application

T. Mizutani1, K. Takeuchi1, T. Saraya1, M. Kobayashi1, T. Hiramoto1 (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2017.E-5-04