10:35 AM - 10:50 AM
[E-5-04 (Late News)] Lowering Minimum Operation Voltage (Vmin) in SRAM Array by Post-Fabrication Self-Improvement of Cell Stability by Multiple Stress Application
○T. Mizutani1, K. Takeuchi1, T. Saraya1, M. Kobayashi1, T. Hiramoto1
(1.Univ. of Tokyo (Japan))
https://doi.org/10.7567/SSDM.2017.E-5-04