Population trapping through spectral hole burning in 167Er3+:Y2SiO5

M. IJspeert

doi:https://doi.org/10.7567/SSDM.2017.G-3-06

10:45 AM - 11:00 AM

[G-3-06] Population trapping through spectral hole burning in ¹⁶⁷Er³⁺:Y₂SiO₅

M. IJspeert¹, G. Mariani¹,^○T. Tawara^1,2, K. Shimizu¹, H. Omi^1,2, S. Adachi³, H. Gotoh¹ (1.NTT Basic Res. Labs. (Japan), 2.NTT Nanophotonics Center (Japan), 3.Hokkaido Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.G-3-06

2017 International Conference on Solid State Devices and Materials

[G-3-06] Population trapping through spectral hole burning in 167Er3+:Y2SiO5

[G-3-06] Population trapping through spectral hole burning in ¹⁶⁷Er³⁺:Y₂SiO₅