4:30 PM - 4:50 PM
[H-2-03] Tilt Characteristics of a MEMS Accelerometer fabricated by Multi-layer Metal Technology
○I. Tsuji1, M. Takayasu1, H. Ito1, D. Yamane1, S. Dosho1, T. Konishi1,2, N. Ishihara1, K. Machida1, K. Masu1
(1.Tokyo Tech (Japan), 2.NTT Adv. Tech. Corp. (Japan))
https://doi.org/10.7567/SSDM.2017.H-2-03