The Japan Society of Applied Physics

10:20 AM - 10:40 AM

[H-5-03] The large-area backside etching method by changing backside layout using loading effect and ARDE for foundry-based fabrication

Y. Okamoto1, Y. Tohyama1, N. Usami1, Y. Mita1 (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2017.H-5-03