14:00 〜 14:15

[J-4-01] Random Telegraph Noise in h-BN under Constant-Voltage Stress Test

^○Y. Hattori¹, T. Taniguchi², K. Watanabe², K. Nagashio^1,3 (1.Univ. of Tokyo (Japan), 2.NIMS (Japan), 3.PRESTO-JST (Japan))

https://doi.org/10.7567/SSDM.2017.J-4-01