14:00 〜 14:20

[K-1-02] Direct Observation of Electrical Dipole and Atomic Density at High-k Dielectrics/SiO₂ Interface

^○N. Fujimura¹, A. Ohta¹, M. Ikeda¹, K. Makihara¹, S. Miyazaki¹ (1.Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.K-1-02