14:45 〜 15:00

[O-4-04] Temperature Distribution Imaging inside Power Devices by Real-Time Simulation

^○A. Watanabe¹, R. Nagao¹, I. Omura¹ (1.Kyushu Inst. of Tech. (Japan))

https://doi.org/10.7567/SSDM.2017.O-4-04