The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors

T. Morimune

doi:https://doi.org/10.7567/SSDM.2017.PS-10-10

[PS-10-10 (Late News)] The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors

T. Morimune¹, H. Kajii², ^○A. Kida¹, M. Miyoshi¹, K. Fukuda¹, K. Tanaka³, H. Fujita⁴ (1.National Inst. of Tech. Kagawa College (Japan), 2.Osaka Univ. (Japan), 3.Nagaoka Univ. of Tech. (Japan), 4.National Inst. of Tech. Kochi College (Japan))

https://doi.org/10.7567/SSDM.2017.PS-10-10

2017 International Conference on Solid State Devices and Materials

[PS-10-10 (Late News)] The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors